A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard
نویسندگان
چکیده
منابع مشابه
A Fault Signature Characterization Based Analog Circuit Testing Scheme and the Extension of IEEE 1149.4 Standard
SUMMARY An analog circuit testing scheme is presented. The testing technique is a sinusoidal fault signature characterization, involving the measurement of DC offset, amplitude, frequency and phase shift, and the realization of two crossing level voltages. The testing system is an extension of the IEEE 1149.4 standard through the modification of an analog boundary module, affording functionalit...
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ژورنال
عنوان ژورنال: IEICE Transactions on Information and Systems
سال: 2010
ISSN: 0916-8532,1745-1361
DOI: 10.1587/transinf.e93.d.33